
Proceedings Paper
Multi-frequency sweeping interferometry using spatial optical frequency modulationFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
We investigated the interference amplitude and phase characteristics of a multi-frequency sweeping interferometer with
sinusoidal phase modulating technique. A novel multi frequency sweeping light source that generated an interval and
center frequency variable frequency comb with a bandwidth of 14 nm was demonstrated. The interference phase and
amplitude distributions were investigated by observing the zeroth and first order interference signals. In addition, the
zeroth and first order interference phase variations caused by center frequency sweeping were measured.
Paper Details
Date Published: 20 November 2012
PDF: 7 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856302 (20 November 2012); doi: 10.1117/12.999555
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
PDF: 7 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856302 (20 November 2012); doi: 10.1117/12.999555
Show Author Affiliations
Samuel Choi, Niigata Univ. (Japan)
Heiichi Kato, Niigata Univ. (Japan)
Heiichi Kato, Niigata Univ. (Japan)
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
© SPIE. Terms of Use
