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Proceedings Paper

Research of dynamic detecting the raw silk fineness on line by a linear CCD and FPGA
Author(s): Feng-jiao Liu; Wang Zhou; Guo-qiang Chen; Hong gen Yi
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Paper Abstract

A new design scheme has been proposed that aim to realize real time, on line raw silk diameter measurement based on linear CCD (Charge Coupled Device) and FPGA (Field Programmable Gate Array).In this system, the samples of raw silk are placed in parallel light which reflect light through macro imaging is received by CCD image sensor. The research on how to improve precision of the system from theoretical approach to various functional modules parameter optimization. What’s more, effects are solved in instability of light illumination and raw silk transparency, linear CCD's dark background imaging is chosen to avoid bright background image easily saturation, distortion caused by raw silk jitter is eliminated. system measurement accuracy reaches to±1μm,experimental results prove that research programme has certain feasibility and practicality.

Paper Details

Date Published: 20 November 2012
PDF: 7 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 85630W (20 November 2012); doi: 10.1117/12.999269
Show Author Affiliations
Feng-jiao Liu, Soochow Univ. (China)
Wang Zhou, Soochow Univ. (China)
Guo-qiang Chen, Soochow Univ. (China)
Hong gen Yi, Soochow Univ. (China)

Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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