
Proceedings Paper
Research of dynamic detecting the raw silk fineness on line by a linear CCD and FPGAFormat | Member Price | Non-Member Price |
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Paper Abstract
A new design scheme has been proposed that aim to realize real time, on line raw silk diameter
measurement based on linear CCD (Charge Coupled Device) and FPGA (Field Programmable Gate
Array).In this system, the samples of raw silk are placed in parallel light which reflect light through macro
imaging is received by CCD image sensor. The research on how to improve precision of the system from
theoretical approach to various functional modules parameter optimization. What’s more, effects are solved
in instability of light illumination and raw silk transparency, linear CCD's dark background imaging is
chosen to avoid bright background image easily saturation, distortion caused by raw silk jitter is eliminated.
system measurement accuracy reaches to±1μm,experimental results prove that research programme has
certain feasibility and practicality.
Paper Details
Date Published: 20 November 2012
PDF: 7 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 85630W (20 November 2012); doi: 10.1117/12.999269
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
PDF: 7 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 85630W (20 November 2012); doi: 10.1117/12.999269
Show Author Affiliations
Guo-qiang Chen, Soochow Univ. (China)
Hong gen Yi, Soochow Univ. (China)
Hong gen Yi, Soochow Univ. (China)
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
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