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Proceedings Paper

Quality discrimination method for write-once optical disk
Author(s): Hyung-Kyu Kim; Woon-Seong Yeo; Dongseok Bae
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Paper Abstract

The conventional inspection method for write-once optical disk such as CD-R is mostly dependent on sampling and visual inspection. The sampling inspection can comparatively analyze disk quality in physical, optical and signal characteristics. Also, the visual inspection method by photo-scanning is not sufficient to detect disk defects. Furthermore, the sampling method has destructive characteristics that prevent disks from whole inspection in fabrication process because CD-R is write-once disk. On the other hands, our new method can do the whole and non-destructive inspection and discriminate exactly whether a disk is good or bad by recording and reading signals in outer area of disk. It has shorter process time than that of the conventional method. Our method does not hurt the international standards because ofusing an outer area rather than an user area of a disk i.e., beyond of Φ 118mm. The disk inspected by our new method has perfect compatibility with existing CD-R or CD-RW drives. Consequently, our new method is able to apply into CD-R fabrication process and duplication process by discriminating quality of CD-R disk, in manufacturing and before duplicating respectively.

Paper Details

Date Published: 28 June 1999
PDF: 3 pages
Proc. SPIE 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999, 386415 (28 June 1999); doi: 10.1117/12.997578
Show Author Affiliations
Hyung-Kyu Kim, LG Electronics Inc. (Korea, Republic of)
Woon-Seong Yeo, LG Electronics Inc. (South Korea)
Dongseok Bae, LG Electronics Inc. (South Korea)

Published in SPIE Proceedings Vol. 3864:
Joint International Symposium on Optical Memory and Optical Data Storage 1999
Shigeo R. Kubota; Ryuichi Katayama; Douglas G. Stinson, Editor(s)

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