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Proceedings Paper

Chalcogenide glass thin films: Z-Scan measurements of refractive index changes
Author(s): Francesco Michelotti; Mario Bertolotti; Valentin N. Ciumash; Andrei M. Andriesh
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Paper Abstract

Nonlinear properties of chacolgenide glass A52S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.

Paper Details

Date Published: 2 February 1993
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Proc. SPIE 1773, Photonics for Computers, Neural Networks, and Memories, (2 February 1993); doi: 10.1117/12.983231
Show Author Affiliations
Francesco Michelotti, Univ. di Roma (Italy)
Mario Bertolotti, Univ. di Roma (Italy)
Valentin N. Ciumash, Academy of Sciences of Moldova (Moldova)
Andrei M. Andriesh, Academy of Sciences of Moldova (Moldova)


Published in SPIE Proceedings Vol. 1773:
Photonics for Computers, Neural Networks, and Memories
Stephen T. Kowel; John A. Neff; William J. Miceli, Editor(s)

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