Share Email Print

Proceedings Paper

Chalcogenide glass thin films: Z-Scan measurements of refractive index changes
Author(s): Francesco Michelotti; Mario Bertolotti; Valentin N. Ciumash; Andrei M. Andriesh
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Nonlinear properties of chacolgenide glass A52S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.

Paper Details

Date Published: 2 February 1993
Proc. SPIE 1773, Photonics for Computers, Neural Networks, and Memories, (2 February 1993); doi: 10.1117/12.983231
Show Author Affiliations
Francesco Michelotti, Univ. di Roma (Italy)
Mario Bertolotti, Univ. di Roma (Italy)
Valentin N. Ciumash, Academy of Sciences of Moldova (Moldova)
Andrei M. Andriesh, Academy of Sciences of Moldova (Moldova)

Published in SPIE Proceedings Vol. 1773:
Photonics for Computers, Neural Networks, and Memories
Stephen T. Kowel; John A. Neff; William J. Miceli, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?