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Proceedings Paper

The design of a multi-point probe for a scanning low-coherence distance-measuring interferometer
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Paper Abstract

A highly efficient method for splitting the probe beam produced by a scanning low-coherence distance-measuring interferometer (SLCDI) is presented. The SLCDI is used to measure thicknesses of materials with thicknesses in the range of 12 microns-50 mm, with a repeatability of 0.1 microns. The measurements are made optically with a beam with a wavelength of 1.3 microns. The SLCDI is also capable of simultaneous measurement of a stack of multiple films. Splitting of the beam from the SLCDI probe to create a multi-point probe allows for multiple, simultaneous measurements to be made at a surface. An advantage of this capability is that it provides the ability of to measure the surface normal at each of the surfaces that are under test. The operation of the SLCDI will be described along with how the operation impacts the requirements for the multi-point probe system. The requirements are discussed from the standpoint of the coherence length of the SLCDI source and the operational usage of the probe. The splitting is achieved through the use of polarization components. The function and performance of the resulting probe is also discussed.

Paper Details

Date Published: 18 December 2012
PDF: 8 pages
Proc. SPIE 8550, Optical Systems Design 2012, 85500W (18 December 2012); doi: 10.1117/12.980928
Show Author Affiliations
Christopher T. Cotton, ASE Optics, LLC (United States)
Christopher J. Ditchman, ASE Optics, LLC (United States)
Nathan E. Burdick, ASE Optics, LLC (United States)
Damon W. Diehl, Monroe Community College (United States)

Published in SPIE Proceedings Vol. 8550:
Optical Systems Design 2012
Laurent Mazuray; Daniel G. Smith; Jean-Luc M. Tissot; Tina E. Kidger; Frank Wyrowski; Stuart David; Rolf Wartmann; Jeffrey M. Raynor; Andrew P. Wood; Pablo Benítez; Andreas Erdmann; Marta C. de la Fuente, Editor(s)

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