
Proceedings Paper
Simulation of cylindrical interferometric testing with position error of bearingFormat | Member Price | Non-Member Price |
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Paper Abstract
The surface microstructure of engine cylinder is critical to its performance. To reduce wear and generated noise, a submicron
and even nanometer smooth surface is required, so more requirements are needed for traditional measurement.
While interferometric optical profilers are often used for testing surface microstructure and this technique is both
noncontact and nondestructive, we set up a cylindrical interferometric measurement system to get the surface shape of
engine cylinder wall. This system includes the interferometer, the cylindrical wave converter and a platform with five-dimensional
precise adjustment. Considering the aberration affected by the real experiment condition, it is almost
impossible to measure the surface profile of the tested object with displacement from a best-fit reference cylinder. In this
paper, we set up a model to simulate the interferogram when the axis of measured object is off the cylindrical focus line.
As the actual experiment environment, there are four situations about the position error of measured object and the exit
pupil wave surface formula for each case can be built by the physical optics. If tested object center is slightly displaced
from the focal line, the formula of the wave surface can be simplified. Then we can get the interferogram by using the
formula. The paper also compares the simulation results with the ones by Zemax software to verify the testing mode.
Paper Details
Date Published: 18 December 2012
PDF: 8 pages
Proc. SPIE 8550, Optical Systems Design 2012, 85501O (18 December 2012); doi: 10.1117/12.978985
Published in SPIE Proceedings Vol. 8550:
Optical Systems Design 2012
Laurent Mazuray; Daniel G. Smith; Jean-Luc M. Tissot; Tina E. Kidger; Frank Wyrowski; Stuart David; Rolf Wartmann; Jeffrey M. Raynor; Andrew P. Wood; Pablo Benítez; Andreas Erdmann; Marta C. de la Fuente, Editor(s)
PDF: 8 pages
Proc. SPIE 8550, Optical Systems Design 2012, 85501O (18 December 2012); doi: 10.1117/12.978985
Show Author Affiliations
Dongbao Ge, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (China)
Published in SPIE Proceedings Vol. 8550:
Optical Systems Design 2012
Laurent Mazuray; Daniel G. Smith; Jean-Luc M. Tissot; Tina E. Kidger; Frank Wyrowski; Stuart David; Rolf Wartmann; Jeffrey M. Raynor; Andrew P. Wood; Pablo Benítez; Andreas Erdmann; Marta C. de la Fuente, Editor(s)
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