Share Email Print

Proceedings Paper

A Method For Extending The Measurement Range Of A Two-Dimensional Surface Profiling Instrument
Author(s): E. R. Cochran; K. Creath
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper discusses the application of interferometric subaperture testing techniques to a two-dimensional optical surface profiling instrument. The optical profiler, a phase-modulated interference microscope, enables the acquisition of a high density of data over a restricted range. The extent of a profile measurement range is determined by the microscope objective used in the interferometer. However, by overlapping a series of collinear interferograms it becomes possible to increase the limited field of view of this instrument. An outline summarizing the instrument and the algorithms used to concatenate interferograms is presented, as well as experimental data obtained from the instrument. Various methods for characterizing the errors that are introduced by the concatenation of a series of interferograms are discussed. Results of a Monte Carlo simulation study on computer-generated data sets is analyzed to further illuminate error sources and limitations of this technique.

Paper Details

Date Published: 1 January 1987
PDF: 10 pages
Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); doi: 10.1117/12.978908
Show Author Affiliations
E. R. Cochran, University of Arizona (United States)
K. Creath, WYKO Corporation (United States)

Published in SPIE Proceedings Vol. 0818:
Current Developments in Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?