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Proceedings Paper

On The Measurement Of Mm-Wave Propagation Characteristics Of GaAs Microstrip Lines
Author(s): Robert R. Romanofsky; Kim Adaway; Kul B. Bhasin
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Paper Abstract

A thorough analytical procedure is developed for evaluating the frequency dependent loss characteristics and effective permittivity of millimeter-wave microstrip lines. The technique is based on the measured reflection coefficient of microstrip resonator pairs. Experimental data including Q factor, effective relative permittivity, and fringing for 50 Ω lines on GaAs was obtained. Effects of an imperfect open circuit, coupling losses, and loading of the resonant frequency are considered. A cosine tapered ridge guide fixture was used to characterize the resonators.

Paper Details

Date Published: 18 November 1989
PDF: 2 pages
Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); doi: 10.1117/12.978456
Show Author Affiliations
Robert R. Romanofsky, Lewis Research. Center (United States)
Kim Adaway, Lewis Research. Center (United States)
Kul B. Bhasin, Lewis Research. Center (United States)

Published in SPIE Proceedings Vol. 1039:
13th Intl Conf on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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