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Proceedings Paper

Analysis Of Finlines On Biaxial Anisotropic Dielectric
Author(s): F. A. F. Tejo; A. G. d'Assuncao; A. J. Giarola
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Paper Abstract

An analysis of finlines on layered biaxial aniso-tropic dielectric substrate using the finite element method is developed. The spurious modes are eliminated by imposing the restriction ∫Ω∇.Η2dΩ = 0 to the used functional with a consequent reduction of matrix size of the resultant eigenvalue problem. The basic formulation is presented and the eigenvalue equation for the calculation of the effective dielectric constant is given.

Paper Details

Date Published: 18 November 1989
PDF: 2 pages
Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); doi: 10.1117/12.978429
Show Author Affiliations
F. A. F. Tejo, Federal University of Paraiba (Brazil)
A. G. d'Assuncao, Federal University of Rio Grande do Norte (Brazil)
A. J. Giarola, State University of Campinas (Brazil)

Published in SPIE Proceedings Vol. 1039:
13th Intl Conf on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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