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Proceedings Paper

A Laser Unequal Path Interferometer (Lupi)* For The Optical Shop
Author(s): Joseph B. Houston Jr.; C. John Buccini; Patrick K. O'Neill
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Paper Abstract

The application of laser technology has beeh extended to optical shop testing by incorporating a continuous wave, helium-neon gas laser in a package that houses a modified Twyman-Green interferometer. This modification provides for optical testing over large path differences with an auxiliary set of lenses used in the long path and a small reference flat used in the short path of the interferometer. With this technique, f/0.7 spherical mirrors have been tested at the center of curvature to an accuracy of 1/10 wavelength at the surface, and various other optical systems have been tested in both double pass and single pass. Two of the advantages of this testing method are (1) the capability of testing spherical concave surfaces without physically contacting the surface and (2) the ability to use small reference surfaces for large optical components or systems. The device, known as a laser unequal path interferometer, can be used with a set of null lenses to qualify aspheric surfaces. The unit is portable and capable of testing in any orientation under various environmental conditions. Several applications of this device are presented to illustrate its versatility.

Paper Details

Date Published: 1 November 1967
PDF: 10 pages
Proc. SPIE 0009, Photo-Optical Systems Evaluation, (1 November 1967); doi: 10.1117/12.978089
Show Author Affiliations
Joseph B. Houston Jr., Itek Corporation (United States)
C. John Buccini, Itek Corporation (United States)
Patrick K. O'Neill, Itek Corporation (United States)

Published in SPIE Proceedings Vol. 0009:
Photo-Optical Systems Evaluation
Fred M. Emens, Editor(s)

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