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Proceedings Paper

Influences of oil-contamination on LIDT and optical properties in dielectric coatings
Author(s): H. Murakami; T. Jitsuno; S. Motokoshi; E. Sato; K. Mikami; K. Kato; T. Kawasaki; Y. Nakata; N. Sarukura; T. Shinizu; H. Shiraga; N. Miyanaga; H. Azechi
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Paper Abstract

Laser-induced damage threshold (LIDT) in optical coating is very sensitive to organic contaminations accumulated in coating layers during storage and using condition. The sources of contamination are commonly exists, and optical coatings are easily contaminated regardless to the environment pressure, LIDT at ns region decreased largely by contamination, but LIDT at ps seems insensitive. In this study, we have investigated the influence of contamination of optical coating on LIDT and other optical properties. We examined several kinds of coating to clarify the sensitivity to the contamination. Degradations of LIDT were commonly observed in e-beam deposition, IAD and IBS. Some coatings changed spectral characteristics by contamination, and other coatings did not change. Some samples were contaminated as received condition, and some were very clean. Furthermore, we have investigated the characteristics of LIDT in dielectric coatings under the controlled contamination. LIDT of coating drops to 1/2 in the saturated toluene vapor at room temperature.

Paper Details

Date Published: 4 December 2012
PDF: 7 pages
Proc. SPIE 8530, Laser-Induced Damage in Optical Materials: 2012, 853024 (4 December 2012); doi: 10.1117/12.977705
Show Author Affiliations
H. Murakami, Osaka Univ. (Japan)
T. Jitsuno, Osaka Univ. (Japan)
S. Motokoshi, Osaka Univ. (Japan)
E. Sato, Osaka Univ. (Japan)
K. Mikami, Osaka Univ. (Japan)
K. Kato, Promotion Ctr. for Laser Technology (Japan)
Osaka Univ. (Japan)
T. Kawasaki, Osaka Univ. (Japan)
Y. Nakata, Osaka Univ. (Japan)
N. Sarukura, Osaka Univ. (Japan)
T. Shinizu, Osaka Univ. (Japan)
H. Shiraga, Osaka Univ. (Japan)
N. Miyanaga, Osaka Univ. (Japan)
H. Azechi, Osaka Univ. (Japan)

Published in SPIE Proceedings Vol. 8530:
Laser-Induced Damage in Optical Materials: 2012
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M J Soileau, Editor(s)

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