
Proceedings Paper
Simulation of high-resolution linear CCD satellite imageFormat | Member Price | Non-Member Price |
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Paper Abstract
In order to estimate the ability and quality of high-resolution linear CCD optical remote sensing satellite in advanced, the
flat terrain and urban region with high buildings were selected as the experimental region. For flat terrain, the data source
for simulation was DEM and existent orthography. For the urban region, the data source was 3D models. When satellite
image was simulating, the imaging model was the principle of line perspective and typical geometrical error in the sensor
system was considered. The radiation transmission of imaging was analyzed and realized with the look-up table which
constructed by 6S radiation transmission model. Finally, the simulated image of geometrical distortion rules was
examine by experiment, and the results shows that the imaging simulation can achieve very good performance.
Paper Details
Date Published: 16 October 2012
PDF: 7 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 841615 (16 October 2012); doi: 10.1117/12.977425
Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)
PDF: 7 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 841615 (16 October 2012); doi: 10.1117/12.977425
Show Author Affiliations
Rui Zhang, Information Engineering Univ. (China)
Sheng Luo, Information Engineering Univ. (China)
Gang-wu Jiang, Information Engineering Univ. (China)
Sheng Luo, Information Engineering Univ. (China)
Gang-wu Jiang, Information Engineering Univ. (China)
Ting Jiang, Information Engineering Univ. (China)
Man Sun, People's Liberation Army (China)
Man Sun, People's Liberation Army (China)
Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)
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