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Proceedings Paper

Measurement Of Semiconductor Laser Linewidth Enhancement Factor Using Coherent Optical Feedback
Author(s): Ki-Hyun Chung; John G. McInerney; Marek Osinski
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Paper Abstract

The linewidth enhancement factor a of a semiconductor injection laser is defined to be the ratio of the changes in the real and imaginary parts of the complex susceptibility of the laser medium due to carrier density variations. We have devised a novel method for measuring this parameter by observing the changes in the optical frequency and external quantum efficiency due to coherent optical feedback. The wavelength dependence of a close to the room-temperature gain peak was measured for GaAs/GaAlAs channeled-substrate-planar devices.

Paper Details

Date Published: 22 June 1989
PDF: 9 pages
Proc. SPIE 1043, Laser Diode Technology and Applications, (22 June 1989); doi: 10.1117/12.976369
Show Author Affiliations
Ki-Hyun Chung, University of New Mexico (United States)
John G. McInerney, University of New Mexico (United States)
Marek Osinski, University of Tokyo (Japan)

Published in SPIE Proceedings Vol. 1043:
Laser Diode Technology and Applications
Luis Figueroa, Editor(s)

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