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Proceedings Paper

Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays
Author(s): Stanley L. Reinhold; J. Michael Finlan; John G. Lehman; Scott M. Hamilton
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Paper Abstract

We report measurements of the near-field phase of a two-dimensional array of grating surface emitter diode lasers. The measurements were performed by scanning single and double slits. We use the individually measured phases over 300 μm x 50 μm emitting regions to predict the beam quality, and we compare the predictions with measured data.

Paper Details

Date Published: 22 June 1989
PDF: 7 pages
Proc. SPIE 1043, Laser Diode Technology and Applications, (22 June 1989); doi: 10.1117/12.976363
Show Author Affiliations
Stanley L. Reinhold, GE Astro-Space Division (United States)
J. Michael Finlan, GE Astro-Space Division (United States)
John G. Lehman, GE Astro-Space Division (United States)
Scott M. Hamilton, GE Astro-Space Division (United States)

Published in SPIE Proceedings Vol. 1043:
Laser Diode Technology and Applications
Luis Figueroa, Editor(s)

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