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Proceedings Paper

Optical Techniques For Aiding VLSI Testing
Author(s): A. P. Goutzoulis; P. J. Chantry
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Paper Abstract

The use of acousto-optic and electro-optic signal processing for aiding the testing of high speed and/or high density VLSI circuits is introduced. Various VLSI testing scenarios that involve comparison of the chip output and the expected reference output are discussed. Two acousto-optic architectures are discussed that could be useful for recording and com-paring high speed digital data. Experimental proof-of-principle results are presented along with a prototype processor module. The acousto-optic and electro-optic implementation of a third architecture that is useful for comparing and compressing high speed digital data, is also discussed along with initial experimental results.

Paper Details

Date Published: 23 March 1986
PDF: 9 pages
Proc. SPIE 0698, Real-Time Signal Processing IX, (23 March 1986); doi: 10.1117/12.976265
Show Author Affiliations
A. P. Goutzoulis, Westinghouse Research and Development Center (United States)
P. J. Chantry, Westinghouse Research and Development Center (United States)

Published in SPIE Proceedings Vol. 0698:
Real-Time Signal Processing IX
William J. Miceli, Editor(s)

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