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Proceedings Paper

Alignment of a Spectrometer for Soft X-Ray Laser Diagnostics
Author(s): Hector Medecki
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Paper Abstract

The characterization of x-ray laser radiation requires the measurement of the radiation wavelengths, their brightness, and their temporal evolution. The spectrometer used for this application includes a focusing, grazing-incidence ellipsoidal mirror, a transmission grating for spectral resolution, and a soft x-ray streak camera to time-resolve and record the spectrum. This paper describes the bench alignment of the spectrometer and its alignment at the laser facility before each shot. Particular emphasis is put in the fact that only optical techniques were used for both alignments, relying on the correlation between the behavior of each component at optical and x-ray wavelengths.

Paper Details

Date Published: 12 May 1986
PDF: 7 pages
Proc. SPIE 0608, Optical Alignment III, (12 May 1986); doi: 10.1117/12.976191
Show Author Affiliations
Hector Medecki, University of California (United States)

Published in SPIE Proceedings Vol. 0608:
Optical Alignment III
Mitchell C. Ruda, Editor(s)

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