
Proceedings Paper
Optical components damage parameters database systemFormat | Member Price | Non-Member Price |
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$17.00 | $21.00 |
Paper Abstract
Optical component is the key to large-scale laser device developed by one of its load capacity is directly related to the
device output capacity indicators, load capacity depends on many factors. Through the optical components will damage
parameters database load capacity factors of various digital, information technology, for the load capacity of optical
components to provide a scientific basis for data support; use of business processes and model-driven approach, the
establishment of component damage parameter information model and database systems, system application results that
meet the injury test optical components business processes and data management requirements of damage parameters,
component parameters of flexible, configurable system is simple, easy to use, improve the efficiency of the optical
component damage test.
Paper Details
Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180W (15 October 2012); doi: 10.1117/12.975963
Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)
PDF: 6 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180W (15 October 2012); doi: 10.1117/12.975963
Show Author Affiliations
Yizheng Tao, Institute of Computer Application (China)
Xinglan Li, Institute of Computer Application (China)
Yuquan Jin, Institute of Computer Application (China)
Xinglan Li, Institute of Computer Application (China)
Yuquan Jin, Institute of Computer Application (China)
Dongmei Xie, Institute of Computer Application (China)
Dingyong Tang, Institute of Computer Application (China)
Dingyong Tang, Institute of Computer Application (China)
Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)
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