
Proceedings Paper
Ultraprecision optical fabrication on fused silicaFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, an optical fabrication process is introduced in detail, which is about achieving ultra-precision surface by
iteration of ion beam figuring (IBF) and supersmooth polishing technology. Developed as a new technology to achieve
supersmooth surface, Numerical controlled micro-jet polishing (MJP) technology is also introduced. 100mm-diameter
fused silica is used as the sample. In the process, the surface is superpolished with MJP at first, then IBF is used to
correct the figure, and finally MJP is applied again to finish iteration process. The path for IBF is raster scanning, and
MJP processes in a spiral way. The figure and roughness of the surface are tested and analyzed with interferometer and
atomic force microscope (AFM). The results indicate that ultra-precision optical surface is achieved by the iteration
process with figure accuracy of 0.879nmrms, mid-spatial frequency and high-spatial frequency roughness of
0.119nmrms and 0.0726nmrms respectively.
Paper Details
Date Published: 16 October 2012
PDF: 6 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 841620 (16 October 2012); doi: 10.1117/12.975836
Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)
PDF: 6 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 841620 (16 October 2012); doi: 10.1117/12.975836
Show Author Affiliations
Junlin Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)
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