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Proceedings Paper

Using Photo Voltaic Diodes To Measure The Deformation Response Of A Structure Subjected To An Explosive Load
Author(s): G. N. Nurick
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Paper Abstract

This paper describes a technique which measures the deflection-time history of a structure subjected to an explosive load. Photo voltaic diodes are used to measure the light interference patterns obtained during deformation. Deflections of up to 20 mm over a time period of 200 μs have been observed.

Paper Details

Date Published: 1 September 1987
PDF: 12 pages
Proc. SPIE 0674, 17th Intl Congress on High Speed Photography and Photonics, (1 September 1987); doi: 10.1117/12.975555
Show Author Affiliations
G. N. Nurick, University of Cape Town (South Africa)

Published in SPIE Proceedings Vol. 0674:
17th Intl Congress on High Speed Photography and Photonics
Donald Hollingworth; Maurice W. McDowell, Editor(s)

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