Proceedings Paper
Magnetic field sensor with Terfenol-D thin-film coated FBG| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
In this work a magnetic field sensor based on an FBG coated with a thin film of Terfenol-D is presented. The sensor was
tested with two optical interrogation systems: one, a scanning laser system with a 1 pm resolution, and the other a
differential white light interferometer (WLI). The results obtained in the magnetic field range of 20 mT to 100 mT, show
the possibility of increasing the magnetic field measurement resolution, with temperature fluctuations invariance, by a
factor of 4.5 when using the WLI system.
Paper Details
Date Published: 17 October 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 84213C (17 October 2012);
Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 84213C (17 October 2012);
Show Author Affiliations
Ricardo M. Silva, INESC Porto (Portugal)
Univ. do Porto (Portugal)
G. Chesini, INESC Porto (Portugal)
Univ. Estadual de Campinas (Brazil)
C. J. Gouveia, INESC Porto (Portugal)
Univ. da Madeira (Portugal)
A. B. Lobo Ribeiro, Univ. Fernando Pessoa (Portugal)
Univ. do Porto (Portugal)
G. Chesini, INESC Porto (Portugal)
Univ. Estadual de Campinas (Brazil)
C. J. Gouveia, INESC Porto (Portugal)
Univ. da Madeira (Portugal)
A. B. Lobo Ribeiro, Univ. Fernando Pessoa (Portugal)
O. Frazão, INESC Porto (Portugal)
C. M. B. Cordeiro, Univ. Estadual de Campinas (Brazil)
P. A. S. Jorge, INESC Porto (Portugal)
C. M. B. Cordeiro, Univ. Estadual de Campinas (Brazil)
P. A. S. Jorge, INESC Porto (Portugal)
Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)
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