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Proceedings Paper

Optical fiber sensors fabricated by the focused ion beam technique
Author(s): Wu Yuan; Fei Wang; Ole Bang
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Paper Abstract

Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of a fiber taper, and a highly sensitive in-line temperature sensor in a PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired patterns of air holes in a PCF.

Paper Details

Date Published: 7 November 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 842173 (7 November 2012);
Show Author Affiliations
Wu Yuan, Singapore Institute of Manufacturing Technology (Singapore)
Fei Wang, Technical Univ. of Denmark (Denmark)
Ole Bang, Techincal Univ. of Denmark (Denmark)

Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)

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