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Proceedings Paper

Stray light analysis of nearby slot source using integrated ray tracing technique
Author(s): Eunsong Oh; Jinsuk Hong; Sug-Whan Kim; Seongick Cho; Joo-Hyung Ryu
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Paper Abstract

In the remote sensing researches, the reflected bright source from out of FOV has effects on the image quality of wanted signal. Even though those signal from bright source are adjusted in corresponding pixel level with atmospheric correction algorithm or radiometric correction, those can be problem to the nearby signal as one of the stray light source. Especially, in the step and stare observational method which makes one mosaic image with several snap shots, one of target area can affect next to the other snap shot each other. Presented in this paper focused on the stray light analysis from unwanted reflected source for geostationary ocean color sensor. The stray light effect for total 16 slot images to each other were analyzed from the unwanted surrounding slot sources. For the realistic simulation, we constructed system modeling with integrated ray tracing (IRT) technique which realizes the same space time in the remote sensing observation among the Sun, the Earth, and the satellite. Computed stray light effect in the results of paper demonstrates the distinguishable radiance value at the specific time and space.

Paper Details

Date Published: 19 November 2012
PDF: 10 pages
Proc. SPIE 8533, Sensors, Systems, and Next-Generation Satellites XVI, 85331R (19 November 2012); doi: 10.1117/12.974455
Show Author Affiliations
Eunsong Oh, Korea Institute of Ocean Science and Technology (Korea, Republic of)
Jinsuk Hong, Samsung Thales Co., Ltd. (Korea, Republic of)
Sug-Whan Kim, Yonsei Univ. (Korea, Republic of)
Seongick Cho, Korea Institute of Ocean Science and Technology (Korea, Republic of)
Yonsei Univ. (Korea, Republic of)
Joo-Hyung Ryu, Korea Institute of Ocean Science and Technology (Korea, Republic of)

Published in SPIE Proceedings Vol. 8533:
Sensors, Systems, and Next-Generation Satellites XVI
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda, Editor(s)

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