
Proceedings Paper
Design of aspheric surfaces testing system based on computer-generated hologramsFormat | Member Price | Non-Member Price |
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Paper Abstract
Aspheric optical surfaces are often tested using computer generated holograms (CGHs). CGHs can generate any desired
wavefronts to realize phase compensation. In addition to fabrication errors of CGH, adjustment errors of testing system
can seriously affect the precision of aspheric surfaces testing. In order to eliminate adjustment errors of CGH and the
tested aspheric, this paper designs a new layout of CGH that has the advantages of high adjustment accuracy and simple
experimental operation. What is more, this paper provides a full set of design idea and design process for the engineering
application of aspheric surfaces testing. Finally, combined with the current international processing and testing levels,
simulation analysis results of all kinds of errors in the aspheric testing system, which shows that this system meets the
requirements of high precision aspheric surfaces testing.
Paper Details
Date Published: 15 October 2012
PDF: 10 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180R (15 October 2012); doi: 10.1117/12.973759
Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)
PDF: 10 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180R (15 October 2012); doi: 10.1117/12.973759
Show Author Affiliations
Jie Feng, Institute of Optics and Electronics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Chao Deng, Institute of Optics and Electronics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Chao Deng, Institute of Optics and Electronics (China)
Ting-wen Xing, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)
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