
Proceedings Paper
Segment and spline synthesis optimization method for LED based freeform total-internal-reflection lens designFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
This paper presents a segment and spline synthesis optimization method (SSS method) for the freeform total-internal-reflection
(TIR) lens design. Before the optimization starts, a series of discrete control points are used to describe the TIR
lens profile. In order to realize initial optimization, the segment method is applied to optimize a linear-segmented TIR
lens. The final optimization is further achieved by the spline optimization method, after which the cubic-spline-modeling
TIR lens with the characteristic of low cost and easy fabrication could satisfy the target illumination requirements. The
detailed design principle and optimization process of the SSS method are both analyzed and compared in the paper.
Complementing each other, the synthesis of the segment and spline optimization method could realize the prescribed
design and greatly improve the design efficiency for designers. As an example, the specially designed polymethyl
methacrylate (PMMA) freeform TIR lens used for LED general lighting could demonstrate the effectiveness of this
method. The uniformity of the lens significantly increases from 67% to 88% after the segment and spline method,
respectively. High light output efficiency (LOE) of 99.3% is available within the target illumination area for the final
lens system. It is believed that the SSS method could be applied to design other freeform illumination optics.
Paper Details
Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200T (15 October 2012); doi: 10.1117/12.973665
Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)
PDF: 8 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200T (15 October 2012); doi: 10.1117/12.973665
Show Author Affiliations
Enguo Chen, Zhejiang Univ. (China)
Zhenfeng Zhuang, Zhejiang Univ. (China)
Jin Cai, Zhejiang Univ. (China)
Zhenfeng Zhuang, Zhejiang Univ. (China)
Jin Cai, Zhejiang Univ. (China)
Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)
© SPIE. Terms of Use
