
Proceedings Paper
Design of high-resolution digital microscope eyepiece based on FPGAFormat | Member Price | Non-Member Price |
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Paper Abstract
The paper presents a low-cost and portable digital microscope eyepiece based on Field Programmable gate Array
(FPGA). A 1.3 million pixels CMOS (Complementary Metal Oxide Semiconductor) sensor is used as the imaging
sensor. To get higher performance, the image pre-processing is completed on hardware. After that, image data are
transmitted into frame buffer through transmission channel constructed by FIFO and DMA controller. The display
controller gets the data from the frame buffer and sends them to the DVI/HDMI transmitter to encode the data by TMDS.
All the control logic is realized inside one EP2C20 FPGA chip based on SoPC (System on a Programmable Chip)
Framework and Nios II processer core is considered as the control center. The design makes full use of FPGA parallel
and pipeline processing technology to achieve the hardware and software co-design, which complete high-resolution
image acquisition, caching and display. The maximum resolution of real-time preview could reach SXGA (1280 x 1024)
with the frame rate up to 15 fps. The system also integrates SD card interface, which captures the BMP format file into
the SD (Security Digital) card.
Paper Details
Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84190V (15 October 2012); doi: 10.1117/12.973645
Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Zhifeng Wang; Junsheng Yu, Editor(s)
PDF: 7 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84190V (15 October 2012); doi: 10.1117/12.973645
Show Author Affiliations
Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Zhifeng Wang; Junsheng Yu, Editor(s)
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