Diffuser film is one of the main components in liquid crystal display backlight unit. It can cause strong scattering for the light out from the light guide plate, and it have the ability to make diffuse reflection and uniform diffusion of the out light occur. How to improve the brightness, the uniformity of backlight unit, and make it more and more slimmer are not only what manufacturers pursuit to, but also an hotspot recently. In this paper, we make use of the statistical analysis law of laser speckle to achieve the fabrication of diffuser film. According to the requirements for the technical parameters of diffuser film, the structure characteristics of laser speckle and manufacturing methods are analyzed and discussed in detail. They consist of producing the original edition of the laser speckle figure (Photoresist board was used as recording medium to produce embossment laser speckle images, and this is one of the most important process in moulding technology ), using electricity molding system to manufacture metal formwork (It is also called as electrotyping, which is transfer the embossment speckle image from the photoresist board to a metal plate), and moulding replication (In a certain temperature and pressure, template stripes were transferred to the film). The diffusion light uniformity and brightness can be controlled via adjusting intensity distribution and average diameter of the speckles. Then the preliminary experiment results are given under laboratory conditions (argon ion laser, λ=457.9nm), and meanwhile the effects of several common diffuser films are compared in this paper.

Date Published: 16 October 2012
PDF: 6 pages
Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 841611 (16 October 2012); doi: 10.1117/12.973643

Published in SPIE Proceedings Vol. 8416:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)