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Proceedings Paper

A standardized way to select, evaluate, and test an analog-to-digital converter for ultrawide bandwidth radiofrequency signals based on user's needs, ideal, published,and actual specifications
Author(s): Daniel Y. Chang; Neil C. Rowe
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Paper Abstract

The most important adverse impact on the Electronic Warfare (EW) simulation is that the number of signal sources that can be tested simultaneously is relatively small. When the number of signal sources increases, the analog hardware, complexity and costs grow by the order of N2, since the number of connections among N components is O(N*N) and the signal communication is bi-directional. To solve this problem, digitization of the signal is suggested. In digitizing a radiofrequency signal, an Analog-to-Digital Converter (ADC) is widely used. Most research studies on ADCs are conducted from designer/test engineers' perspective. Some research studies are conducted from market's perspective. This paper presents a generic way to select, evaluate and test ultra high bandwidth COTS ADCs and generate requirements for digitizing continuous time signals from the perspective of user's needs. Based on user's needs, as well as vendor's published, ideal and actual specifications, a decision can be made in selecting a proper ADC for an application. To support our arguments and illustrate the methodology, we evaluate a Tektronix TADC-1000, an 8-bit and 12 gigasamples per second ADC. This project is funded by JEWEL lab, NAWCWD at Point Mugu, CA.

Paper Details

Date Published: 18 May 2012
PDF: 10 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83551D (18 May 2012); doi: 10.1117/12.971214
Show Author Affiliations
Daniel Y. Chang, Naval Postgraduate School (United States)
Naval Air Warfare Ctr. Weapons Div. (United States)
Neil C. Rowe, Naval Postgraduate School (United States)

Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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