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Proceedings Paper

Two Dimensional Fourier Transform Infrared (FTIR) Mapping
Author(s): R . L. Mowery; R. R . Smardzewski
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Paper Abstract

A simple device for the two dimensional IR mapping of curved surfaces was developed and interfaced to a diffuse reflectance attachment for an FTIR spectrometer. The device consists of a mounting frame coupled to a micrometer driven translation stage. The sample is longitudinally driven through the focal point of the diffuse reflection attachment. By combining translations with rotations, a two dimensional matrix of spectra from the surface is acquired. The spatial resolution of these spectra approaches 1 mm. A two dimensional mapping of an electrical contact surface reveals an inhomogeneous distribution of a hydrocarbon species (the lubricant) and the presence of a contaminant containing a cyano group.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970802
Show Author Affiliations
R . L. Mowery, Naval Research Laboratory (United States)
R. R . Smardzewski, Naval Research Laboratory (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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