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Proceedings Paper

Dynamic approach to FT-IR spectroelectrochemistry
Author(s): Stuart I. Yaniger; Warren Vidrine
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Paper Abstract

Rapid-scan time-resolved Fourier-transform infrared (FT-IR) spectroscopy is a method that allows one to examine the changes in the infrared spectrum of a system undergoing a chemical or physical change. This method exploits the inherent multiplex advantage of FT-IR; each scan of the FT-IR spectrometer yields the entire infrared spectrum of the sample at the time the scan is taken. Clearly, a time-resoved infrared spectrum can be obtained by storing each scan in a separate computer file. The degree of time resolution is limited by the speed at which the interferometer mirror can be moved and the data system can acquire and store spectral data. At medium spectral resolution (16 cm-1), time resolutions of 12-15 milliseconds are possible using commercially available instrumentation and software, that is, interferograms may be collected and stored at a rate of 65-85 scans per second (1).

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970770
Show Author Affiliations
Stuart I. Yaniger, Nieolet Instrument Corporation (United States)
Warren Vidrine, Nieolet Instrument Corporation (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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