
Proceedings Paper
Laser Diode Array Beam Shaping System Based on Fly's Eye LensFormat | Member Price | Non-Member Price |
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Paper Abstract
The main drawback of diode laser array is the inhomogeneous intensity distribution in the far field. So the beam shaping
technology is very important in the application of laser diode array. This work present a novel beam shaping optical
system based on fly’s eye lens. The system can homogenize the diode laser array based on the multi-aperture beam
integrating theory. Such beam shaping system was designed by ray tracing method using ZEMAX™ Non-Sequential
Components analysis tools. The ray-tracing simulation shows that a 5 × 5 mm2 Top-Hat intensity profile was got at a
working distance of 40 mm and the homogeneity of the intensity distribution is better than 90%. And it is verified that
such beam shaping system is adapted for the aberrations of bars very well by simulation. Based on the design, a relative
experimental research on the beam shaping system for 5 bars LD stack is carried out. Through the beam shaping system
the laser diode power intensity is improved 4 times, light field distribution nonuniformity is less than 10%, and the
system coupling efficiency is more than 80%, which validated the engineering feasibility and applied value of this novel
LD array beam shaping system.
Paper Details
Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180J (15 October 2012); doi: 10.1117/12.970477
Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)
PDF: 7 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180J (15 October 2012); doi: 10.1117/12.970477
Show Author Affiliations
Feng Huang, Ordnance Engineering College (China)
Ming Lei, Ordnance Engineering College (China)
Wenwu Jia, Ordnance Engineering College (China)
Ming Lei, Ordnance Engineering College (China)
Wenwu Jia, Ordnance Engineering College (China)
Zhiyong Yin, Ordnance Engineering College (China)
Bin Zhou, Ordnance Engineering College (China)
Yuefeng Wang, Ordnance Engineering College (China)
Bin Zhou, Ordnance Engineering College (China)
Yuefeng Wang, Ordnance Engineering College (China)
Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)
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