
Proceedings Paper
Displacement monitor with FBG deforming ring and its application in high speed railwayFormat | Member Price | Non-Member Price |
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Paper Abstract
A displacement monitor with deforming ring is developed to ensure the FBG suspended and to avoid it to be chirped by
covering glue. The mechanical analysis provides ring size to ensure suitable BFG wavelength shift extent within detected
range. Two pieces of FBG are crosswise fixed on the ring and pre-drawn properly. Rail creep force of high speed railway
makes one tense, the other compress. To add these two wavelength shifts, the sensitivity is doubled, and environmental
temperature interference is eliminated. Its general error is ±0.25% FS; repeatability is 0.2% FS; resolution is 0.1mm; the
temperature error, from -20 to 60Cº, is ±0.45mm in 50mm range.
Paper Details
Date Published: 7 November 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 8421AU (7 November 2012); doi: 10.1117/12.970258
Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 8421AU (7 November 2012); doi: 10.1117/12.970258
Show Author Affiliations
Weilai Li, Wuhan Univ. of Technology (China)
Yanxiao Zhang, Wuhan Univ. of Technology (China)
Qin Wang, Wuhan Univ. of Technology (China)
Yanxiao Zhang, Wuhan Univ. of Technology (China)
Qin Wang, Wuhan Univ. of Technology (China)
Jianjun Pan, Wuhan Univ. of Technology (China)
Jie Liu, Wuhan Univ. of Technology (China)
Ciming Zhou, Wuhan Univ. of Technology (China)
Jie Liu, Wuhan Univ. of Technology (China)
Ciming Zhou, Wuhan Univ. of Technology (China)
Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)
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