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Proceedings Paper

The Use of Linear Arrays in Electronic Speckle Pattern Interferometry
Author(s): Michael Short
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Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) offers high resolution displacement information of objects by analysis of the relative phase between a reference beam of light and an object beam of light at two or more instants in time. The sampling of the data is usually performed with two-dimensional solid-state arrays. Use of a one-dimensional array, however, offers increased displacement resolution or larger field of view, depending upon the optical setup, and offers higher line rates over two-dimensional cameras. The disadvantages imposed by the one-dimensional vs two-dimensional sampling, including object motion restrictions and automatic fringe extraction are discussed.

Paper Details

Date Published: 1 April 1990
PDF: 7 pages
Proc. SPIE 1194, Optics, Illumination, and Image Sensing for Machine Vision IV, (1 April 1990); doi: 10.1117/12.969855
Show Author Affiliations
Michael Short, Digital Design, Inc (United States)

Published in SPIE Proceedings Vol. 1194:
Optics, Illumination, and Image Sensing for Machine Vision IV
Donald J. Svetkoff, Editor(s)

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