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Proceedings Paper

Instrument Noise And The Signal-To-Noise Power Spectrum Of Laser Diode-Based Optical Processors
Author(s): Donald J. Svetkoff; Donald B. Kilgus
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Paper Abstract

The signal-to-noise power spectrum, evaluated through point-spread-function profiling, is of general utility for assessing the quality of an optical system, with implications for most machine vision processors. Recently, this classic test has been applied to laser diode-based processors. In this paper we present empirical findings of the instrument noise spectra of such systems, and illustrate improvements in the instrument function given by various optimization techniques. The resulting low-noise system is used to evaluate the quality of components used in optical processors.

Paper Details

Date Published: 1 April 1990
PDF: 12 pages
Proc. SPIE 1194, Optics, Illumination, and Image Sensing for Machine Vision IV, (1 April 1990); doi: 10.1117/12.969841
Show Author Affiliations
Donald J. Svetkoff, Synthetic Vision Systems Inc. (United States)
Donald B. Kilgus, Synthetic Vision Systems Inc. (United States)

Published in SPIE Proceedings Vol. 1194:
Optics, Illumination, and Image Sensing for Machine Vision IV
Donald J. Svetkoff, Editor(s)

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