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Proceedings Paper

FTIR External Reflection Study Of Molecular Orientation On Semiconductors
Author(s): Jerzy Mielczarski
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Paper Abstract

An infrared external reflection technique has been developed to study the structure of spontaneously adsorbed layers of surfactants on semiconductor (cuprous sulfide) from aqueous solution. Owing to the optical properties of the substrate, positive as well as negative absorption bands are observed in the spectrum depending on the angle of incidence and the polarization. Knowledge of the three theoretically calculated absorbance components, AIIX, A2z and Aiy, makes it possible to predict the absorbance values which match with experimental data and provides for an easier interpretation of the reflection spectra, especially for the case of an anisotropic layer. Generally good agreement has been obtained between experimental and calculated absorbance values.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969561
Show Author Affiliations
Jerzy Mielczarski, Virginia Polytechnic Institute and State University (United States)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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