Share Email Print

Proceedings Paper

Reflection Spectroscopy With The FT-IR Microscope
Author(s): William T. Wihlborg; John A. Reffner; Scott W. Strand; Frank M. Wasacz
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The FT-IR microscope is a versatile sampling accessory used to record IR spectra in either transmittance or reflectance modes and capable of obtaining data from microscopic sampling areas. Because the FT-IR microscope simplifies the collection of reflectance data it has renewed interest in reflectance spectroscopy. Moreover, the ability to see the specific sample and to obtain spectra from small areas makes it possible to differentiate the mode of the reflection data. Reflections can be specular, diffuse or reflection-absorption modes. These modes are not independent, but the sample and its surface geometry can cause one mode to dominate all others. With polished grains or single crystal faces, specular reflection is the dominate mode. Thin films on metallic reflecting substrates make reflection-absorption the major reflection mode. Diffuse reflection dominates when the surface is very rough or fine irregular particles are analyzed. Since the sample can be seen with the microscope, the reflection mode can be predicted by direct observation of the sample's surface. In this work, examples of reflection spectral measurements are presented to illustrate the versatility of the FT-IR microscope. Of particular interest is the first report of quantitative analysis of a copolymer using specular reflectance measurements obtained with the FT-IR microscope. In this analysis, the Kramers-Kroenig transformation was used to obtain extinction (k) values. The k values derived from specular reflection are quantitative agreement with absorbance values measured by transmission.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969473
Show Author Affiliations
William T. Wihlborg, Spectra-Tech Inc (United States)
John A. Reffner, Spectra-Tech Inc (United States)
Scott W. Strand, Spectra-Tech Inc (United States)
Frank M. Wasacz, Spectra-Tech Inc. (United States)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

© SPIE. Terms of Use
Back to Top