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Proceedings Paper

Phase Spectroscopy Of Surface Electromagnetic Waves Using Fourier Spectrometer
Author(s): L. A. Kuzik; V. A. Yakovlev; G. N. Zhizhin; M. A. Chesters; S. F. Parker
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Paper Abstract

The surface electromagnetic wave (SEWS spectroscopy has shown high sensitivity to the state of the surface . The measurements of SEW attenuation andphase retardation during SEW propagation on the sample allow to obtain Ihe optical constants of surface layer or oxide on the metal. Up to now phase spectroscopy used laser sources of radiation, thus the interference measurements were done only in the spectral region where laser lines are available. To apply phase spectroscopy or SEW to the surface analysis widely it is necessary to expand the spectral region where they are studing. High sensitivity or modern Fourier transform spectrometers allows to detect SEW excited by broadband source. We have used Fourier transform spectrometers FTS-20V (Digilab) and Michelson-110 (BOMEM) with liquid nitrogen cooled detectors (Hg-Cd-Te). On silver surface SEW were excited using aperture coupling. The experiment is shown on the fig.1 . IR radiation from interferometer was focused on the gap between the sample 3 surface and the screen 1 placed at the distance of the order of 100 μm. In such a way on the gap propagating along a metal SEW and bulk radiation above the metal are excited.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969468
Show Author Affiliations
L. A. Kuzik, Institute of Spectroscopy (USSR)
V. A. Yakovlev, Institute of Spectroscopy (USSR)
G. N. Zhizhin, Institute of Spectroscopy (USSR)
M. A. Chesters, University of East Anglia (UK)
S. F. Parker, University of East Anglia (UK.)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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