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Proceedings Paper

Eliminating Ftourescence Interference With Near-Ir Fourier Transforn Raman Spectroscopy
Author(s): Francis J. Purcell
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Paper Abstract

Fluorescence interference has been a major impediment to obtaining Raman spectra from many samples illuminated by laser at visible wavelengths. Fourier-transform (FT) Raman spectroscopy in the near-infrared eliminates the problem of fluorescence background, and automated systems designed to apply this advantage in industrial environments make it possible to accurately and conveniently analyze almost any material. FT-Raman data also complements information acquired via FT-IR absorption analysis. Taken on a system combining FT-Raman and IR capabilities, spectra of samples that include alcohols, polymers and amino acids demonstrate the practical utility of these techniques for industrial and research applications. In addition, such instrumentation offers data acquisition speed comparable to conventional Raman analysis, as well as throughput and multiplex advantages. Samples may also be illuminated at higher power in the infrared without rotation to prevent thermal damage.

Paper Details

Date Published: 1 December 1989
PDF: 1 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969465
Show Author Affiliations
Francis J. Purcell, SPEX Industries, Inc. (United States)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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