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Proceedings Paper

Artifacts In FT-Raman Spectroscopy
Author(s): D. Bruce Chase
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Paper Abstract

The rapid improvements in detector technology, interferometer optimization and filter technology have brought the sensitivity in FT-Raman spectroscopy to a point where spectra can be recorded quite readily from most samples. The limitation is no longer due to detector noise. Instead, the problem of spectral artifact lines has now become the primary concern. We have identified several general groups of spectral artifacts, some of which are sample independent.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969411
Show Author Affiliations
D. Bruce Chase, E.I.du Pont (United States)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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