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Proceedings Paper

The research of design mode selection based on test first
Author(s): Shoubai Xiao; Qinghua Zhan
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Paper Abstract

The 23 GOF design patterns are proven to be effective against changes in demand, but the the abuse of design patterns phenomenon are common because of human chase blindly. The abuse of model application invirtually increases the difficulties of code maintenance, and is more harmful than non-usage any design patterns. In this paper, one method of "the choose of design patterns according to test first " is advocated to use design patterns rationally by the way of nonusage any design patterns.

Paper Details

Date Published: 8 June 2012
PDF: 5 pages
Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 833441 (8 June 2012); doi: 10.1117/12.968558
Show Author Affiliations
Shoubai Xiao, Jiangxi Univ. of Technology (China)
Qinghua Zhan, Jiangxi Univ. of Technology (China)

Published in SPIE Proceedings Vol. 8334:
Fourth International Conference on Digital Image Processing (ICDIP 2012)
Mohamed Othman; Sukumar Senthilkumar; Xie Yi, Editor(s)

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