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Proceedings Paper

Displacement Measurement Repeatability In Tens Of Nanometers With Laser Interferometry
Author(s): Charles R Steinmetz
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Paper Abstract

Recent advancements in Hewlett-Packard laser interferometers has made it possible to achieve displacement measurements with a repeatability in the tens of nanometers. This will be of key importance in achieving the submicron geometries in future integrated circuits. This measurement repeatability is achieved by the use of two new products that significantly reduce the major error components of the interferometer system. Before discussing the details of these products, an account is given on how to analyze the measurement repeatability of a laser interferometer system. Each component of the system repeatability budget are discussed. From this analysis it is observed that the most significant error components in this budget are due to atmospheric affects and the thermal drift of the optics. The affects of these errors have been reduced on the Hewlett-Packard system by the use of Wavelength Tracking Compensation and a new high stability interferometer.

Paper Details

Date Published: 1 January 1988
PDF: 15 pages
Proc. SPIE 0921, Integrated Circuit Metrology, Inspection, and Process Control II, (1 January 1988); doi: 10.1117/12.968389
Show Author Affiliations
Charles R Steinmetz, Hewlett-Packard Company (United States)

Published in SPIE Proceedings Vol. 0921:
Integrated Circuit Metrology, Inspection, and Process Control II
Kevin M. Monahan, Editor(s)

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