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Proceedings Paper

High Sensitivity, High Reliability PINFET Receivers
Author(s): Harsh Karande; Collin Fern; H. D. Law; K. Li; T. V. Muoi
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Paper Abstract

Extensive environmental tests followed by a high temperature, powered on life test have been performed on PINFET receivers manufactured at PCO, Inc. These receivers have completed over 6400 hours of powered on life test at 85 Degrees Celsius. Life time calculations cannot be performed since 63% failures have not occurred yet. This paper addresses initial failure modes of earlier construction devices, subsequent design and manufacturing improvements and the latest el ectro-optical, life and environmental performance of these high reliability PINFET receivers.

Paper Details

Date Published: 1 January 1987
PDF: 13 pages
Proc. SPIE 0842, Fiber Optics Reliability: Benign and Adverse Environments, (1 January 1987); doi: 10.1117/12.968181
Show Author Affiliations
Harsh Karande, PCO, Incorporated (United States)
Collin Fern, PCO, Incorporated (United States)
H. D. Law, PCO, Incorporated (United States)
K. Li, PCO, Incorporated (United States)
T. V. Muoi, PCO, Incorporated (United States)

Published in SPIE Proceedings Vol. 0842:
Fiber Optics Reliability: Benign and Adverse Environments
Dilip K. Paul, Editor(s)

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