Proceedings Paper
Application Of Ionization-Type Semiconductor Device For Infra-Red Diagnostics| Format | Member Price | Non-Member Price |
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Paper Abstract
The problem of recording fast processes in IR spectrum remains an urgent one up till now. The authors of /1-3/ proposed a principally new device which they called ionization-type semiconductor system (ITSS). It features high sensitivity and rapid response in a broad spectral range. The ITSS is a promising means for recording and measuring the space-time parameters of IR flash sources.
Paper Details
Date Published: 1 February 1985
PDF: 2 pages
Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); doi: 10.1117/12.967992
Published in SPIE Proceedings Vol. 0491:
16th Intl Congress on High Speed Photography and Photonics
Michel L. Andre; Manfred Hugenschmidt, Editor(s)
PDF: 2 pages
Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); doi: 10.1117/12.967992
Show Author Affiliations
Yu. A. Astrov, All-Union Research Institute for Optical and Physical Measurements (USSR)
Yu. A. Drozhbin, All-Union Research Institute for Optical and Physical Measurements (USSR)
L. N. Portsel, All-Union Research Institute for Optical and Physical Measurements (USSR)
Yu. A. Drozhbin, All-Union Research Institute for Optical and Physical Measurements (USSR)
L. N. Portsel, All-Union Research Institute for Optical and Physical Measurements (USSR)
V. E. Prokopenko, All-Union Research Institute for Optical and Physical Measurements (USSR)
V. B. Semenov, All-Union Research Institute for Optical and Physical Measurements (USSR)
Yu. P. Tusova, All-Union Research Institute for Optical and Physical Measurements (USSR)
V. B. Semenov, All-Union Research Institute for Optical and Physical Measurements (USSR)
Yu. P. Tusova, All-Union Research Institute for Optical and Physical Measurements (USSR)
Published in SPIE Proceedings Vol. 0491:
16th Intl Congress on High Speed Photography and Photonics
Michel L. Andre; Manfred Hugenschmidt, Editor(s)
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