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Proceedings Paper

Wavelength Scaling Of BRDF Scatter Data
Author(s): John C. Stover; Calvin H. Gillespie; Fredrick M. Cady; Daniel R. Cheever; Kyle A. Klicker
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Paper Abstract

Light scattered by optical components is becoming an increasingly troublesome problem in many modern optical designs. Serious attention is now being paid to this issue by several government and industry labs who are using, or are planning to use, scatter measurements as acceptance criteria for optical components. One of the difficulties associated with scatter measurements is the large number of variables that can vary the scatter distribution. In addition to sample parameters, such as roughness, bulk defects and contamination, there are sample independent parameters such as polarization, angle of incidence and wavelength. Separating the various effects is not trivial; although, there can be strong economic motivations to do so. The usual approach has been to make scatter measurements under the conditions expected for actual use--that is, to use the polarization, incident angle and wavelength that are intended for eventual use to make the scatter measurements. Polarization and incident angle are relatively east to adjust in most instruments, but generating different wavelength capabilities is more expensive. In addition, the variable of incident angle has already been examined for the case of reflective optics. [1] This paper examines the possibility that scatter measurements made at one wavelength can be used through a process commonly referred to as wavelength scaling to predict scatter at other wavelengths.

Paper Details

Date Published: 1 January 1987
PDF: 6 pages
Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); doi: 10.1117/12.967439
Show Author Affiliations
John C. Stover, Toomay. Mathis & Associates, Inc. (United States)
Calvin H. Gillespie, LLNL (United States)
Fredrick M. Cady, Toomay. Mathis & Associates, Inc. (United States)
Daniel R. Cheever, Toomay. Mathis & Associates, Inc. (United States)
Kyle A. Klicker, Toomay. Mathis & Associates, Inc. (United States)

Published in SPIE Proceedings Vol. 0818:
Current Developments in Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

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