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Proceedings Paper

Rigorous Analysis Of Diffraction By Thin Gratings
Author(s): Timo Jaaskelainen; Teuvo Hytonen
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Paper Abstract

The most common methods of analyzing diffraction by dielectric gratings are the modal approach and the coupled wave approach, both of which can be exactly formulated. In their rigorous forms these theories are equivalent

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967319
Show Author Affiliations
Timo Jaaskelainen, University of Kuopio (Finland)
Teuvo Hytonen, University of Kuopio (Finland)

Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age
Henri H. Arsenault, Editor(s)

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