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Proceedings Paper

Phase Measuring Interferometry With A Tunable Semiconductor Laser
Author(s): Y. Ishii; J. Chen; K. Murata
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Paper Abstract

Several authors1'2) have developed a digital heterodyne or a fringe-scanning interferometry employing the phase shifter such as a piezoelectric transducer (PZT). Recently semiconductor lasers (LD's) are usable and potentially reliable for key devices in optics. One of the features of LD is tunability, in which the wavelength of a single-mode laser can be changed continuously by the variation of the injection current and/or the temperature of active region. Therefore, it is possible to consider that a phase measuring interferometry can be realized by changing the relative phase difference between the two beams of the interferometer with the frequency modulation of

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967128
Show Author Affiliations
Y. Ishii, The Institute of Vocational and Technical Education (Japan)
J. Chen, Hokkaido University (Japan)
K. Murata, Hokkaido University (Japan)

Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age
Henri H. Arsenault, Editor(s)

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