Proceedings Paper
High-Speed, Pulsed-Laser Interferometry| Format | Member Price | Non-Member Price |
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Paper Abstract
This paper describes a phase-shifting, self-referencing, interferometer, designed for testing rapidly varying optical surfaces or a pulsed laser wavefront quality. It is the modified version of a general class of phase-shifting interferometers without moving parts: the phase shift and separation of beams are obtained with a stationary diffraction grating. The presentation includes results from experiments, and a review of the systems where its use might be appropriate.
Paper Details
Date Published: 1 January 1987
PDF: 6 pages
Proc. SPIE 0802, In-Process Optical Metrology for Precision Machining, (1 January 1987); doi: 10.1117/12.967119
Published in SPIE Proceedings Vol. 0802:
In-Process Optical Metrology for Precision Machining
Peter Langenbeck, Editor(s)
PDF: 6 pages
Proc. SPIE 0802, In-Process Optical Metrology for Precision Machining, (1 January 1987); doi: 10.1117/12.967119
Show Author Affiliations
Osuk Y. Kwon, Lockheed Missiles & Space Company (United States)
Dean M. Shough, Lockheed Missiles & Space Company (United States)
Published in SPIE Proceedings Vol. 0802:
In-Process Optical Metrology for Precision Machining
Peter Langenbeck, Editor(s)
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