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Proceedings Paper

Very Large Scale Integration (VLSI) Approach To Feature Extraction
Author(s): James S. Duncan; Werner Frei
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Paper Abstract

The lower levels of many image processing and pattern recognition systems require a high degree of machine throughput. This is especially true in real-time (or pseudo-real time) systems where all the pixels in an image frame must be processed as quickly as possible. This paper proposes a method directed primarily toward extracting low level features quickly and efficiently. This method is based on projecting the image into characteristic subspaces using appropriate orthogonal basis functions. These basis operators are designed with an emphasis on modularity; thus, they will be useful in hierarchical processing and, significantly, they will fit well into a Very Large Scale Integrated (VLSI) circuit design. Chips consisting of many of these modules, under executive processor control, could now be used in imaging systems that require fast feature detection using compact and efficient hardware.

Paper Details

Date Published: 17 March 1983
PDF: 8 pages
Proc. SPIE 0359, Applications of Digital Image Processing IV, (17 March 1983); doi: 10.1117/12.965988
Show Author Affiliations
James S. Duncan, University of Southern California (United States)
Werner Frei, University of Southern California (United States)

Published in SPIE Proceedings Vol. 0359:
Applications of Digital Image Processing IV
Andrew G. Tescher, Editor(s)

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