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Proceedings Paper

Optical Pattern Recognition By Diffraction Pattern Sampling
Author(s): Harvey L. Kasdan
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Paper Abstract

Optical pattern recognition using diffraction pattern sampling has matured to the point that sophisticated laboratory, factory and scanner systems have been developed. In this paper we review the basic optical theory and a brief history of systems that have been developed. Two state-of-the-art systems will be discussed in greater detail. One is a laboratory configuration, while the other is a high-speed scanner. Recent results obtained utilizing the laboratory system to automatically classify terrain types will be presented. These results illustrate some of the limitations pure diffraction pattern systems have when used for texture measurement. Finally, the implication these results have on future directions of diffraction based systems will be discussed.

Paper Details

Date Published: 4 December 1979
PDF: 7 pages
Proc. SPIE 0201, Optical Pattern Recognition, (4 December 1979); doi: 10.1117/12.965604
Show Author Affiliations
Harvey L. Kasdan, Recognition Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 0201:
Optical Pattern Recognition
David P. Casasent, Editor(s)

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