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Proceedings Paper

X-UV Optics in near-normal incidence realised at the "Institut d'Optique"
Author(s): J. P. Chauvineau; J. P. Marioge; F. Bridou; G. Tissot; L. Valiergue; B. Bonino
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Paper Abstract

Two objectives to be used at 304 Å, in near-normal incidence have been made at IOTA : one is Ritchey-Chretien Telescope, the other is a Schwarzschild microscope used to observe laser heated targets. They are both made from two spherical surfaces shaped with an accuracy of λ/10, and covered by Si/Re-Wmultilayers. For the Ritchey- Chretien, the surfaces were aspherized by vacuum deposition before coating. Multilayer period and interface roughness were evaluated by using X-ray reflectanetry during the deposition process and grazing incidence X-ray reflectometry after the multilayer coating. A 7 A rms roughness for Si, 10 AÅ for W-Re, and a reflectivity of 10% were evaluated for each telescope mirror. For minimazing aberrations, the two mirrors of the Schwarzschild microscope were very accurateley centered. Results shows a resolution better than 4 gm for this instrument at the 304 Å wavelenght used.

Paper Details

Date Published: 1 January 1986
PDF: 7 pages
Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); doi: 10.1117/12.964925
Show Author Affiliations
J. P. Chauvineau, Faculte des Sciences (France)
J. P. Marioge, Faculte des Sciences (France)
F. Bridou, Faculte des Sciences (France)
G. Tissot, Faculte des Sciences (France)
L. Valiergue, Faculte des Sciences (France)
B. Bonino, Faculte des Sciences (France)

Published in SPIE Proceedings Vol. 0733:
Soft X-Ray Optics and Technology
E. Koch; Guenther A. Schmahl, Editor(s)

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