Share Email Print

Proceedings Paper

Laser Plasma Sources for Scanning X-Ray Microscopy
Author(s): A. G. Michette; C.P. B. Hills; A. M. Rogoyski; P. Charalambous
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Measurement of the soft X-ray intensity emitted from the plasma formed by focusing a 20 Hz, 500 mJ Nd:YAG laser beam onto solid targets indicate that a similar soft X-ray source employing a laser with a repetition rate of a few hundred Hz will be suitable for scanning X-ray microscopy. At particular X-ray energies, the brightness of such a source is comparable to that from synchrotron sources such as the (non-upgraded) SRS at Daresbury.

Paper Details

Date Published: 1 January 1986
PDF: 6 pages
Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); doi: 10.1117/12.964887
Show Author Affiliations
A. G. Michette, King's College London (U.K.)
C.P. B. Hills, King's College London (U.K.)
A. M. Rogoyski, King's College London (U.K.)
P. Charalambous, King's College London (U.K.)

Published in SPIE Proceedings Vol. 0733:
Soft X-Ray Optics and Technology
E. Koch; Guenther A. Schmahl, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?